I received a call from an interviewer when I was working on another project. He asked, "Can we talk?" He then started the interview, which lasted for one and a half hours. He primarily focused on the basics of DFT. This was my first interview experience, and it was a really nice experience. The interview took place in Dallas, Texas, USA.

TESTING RELATED:

Why we need testing. Fault analysis system. JTAG. TAP Controller. BIST. Types of fault. What will happen if we put NMOS up and PMOS down in an inverter? Black box vs. white box testing. MTTF. Failure rate over product lifetime. What is the D algorithm? Stuck-at fault. Stuck-open fault. Stuck sort. SCAN. Delay fault models. Checkpoint theorem. How to know that a primary input can be detected by what test patterns for respective stuck-at faults? What happens with an XOR gate? What is level-based analysis? What is structural and non-structural testing? Why we need structural testing? Testability. Observability. Controllability. What is level-based logic simulation and why do we need it? Critical path tracing, etc.

HR Question:

Some 3-bulb questions were asked.

There are two rooms. One room has three bulbs, and another has all three switches. In just one go, you need to find out which switch belongs to which bulb.